Kim, Yong Tae 2024-01-12T09:41:09Z 2024-01-12T09:41:09Z 2022-01-14 2001-10-01 https://pubs.kist.re.kr/handle/201004/83799 Effects of Bi/Sr Stoichiometric Ratio on Electrical Properties of Pt/SrBi2Nb2O9/Si Ferroelectric Gate Structure Conference 1 , pp.0 0 0 AVS 48th International Symposium, 11th International Conference on Solid Surfaces