Lee, Wook Seong Jeong, Jeung hyun 2024-01-12T10:42:41Z 2024-01-12T10:42:41Z 2022-01-14 1999-01-01 https://pubs.kist.re.kr/handle/201004/84979 Micromechanical analysis of residual stress effect in CVD-processed diamond wafer Conference 1 Materials Research Society, USA, pp.373 - 378 Materials Research Society, USA 373 378 Materials Research Society Proceedings