Jeong, Jeung hyun 2024-01-12T10:42:43Z 2024-01-12T10:42:43Z 2022-01-14 1999-01-01 https://pubs.kist.re.kr/handle/201004/84980 Analysis of reliability of thin-film materials for microelectronic components Conference 1 The Korea-U.S. Materials Symposium