Baik, Young Joon 2024-01-12T11:10:37Z 2024-01-12T11:10:37Z 2022-01-14 1998-01-01 https://pubs.kist.re.kr/handle/201004/85453 Characterization of Thick Diamond Film Wafer Grown by Multi-Cathode Direct Current PACVD Conference 1 Int'l Workshop on Surface Engineering and Coatings