Baik, Young Joon 2024-01-12T11:39:41Z 2024-01-12T11:39:41Z 2022-01-14 1996-01-01 https://pubs.kist.re.kr/handle/201004/85956 TEM Characterization of Highly Oriented Diamond Films on (001) Silicon Synthesized by Bias Enhanced Nucleation Technique Conference 1 MRS Fall Meeting