Dae-Young Jeon S. J. Park M. Mouis S. Barraud G. -T. Kim G. Ghibaudo 2024-01-12T12:43:33Z 2024-01-12T12:43:33Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/87271 English 2.5~7, 하이원리조트 series resistance null junctionless transistors null bulk conduction null accumulation conduction Series resistance characterization of junctionless transistors Conference 2 한국반도체학술대회 한국반도체학술대회 KO