김선희 Jang Yun Jung 윤정현 Jeung-hyun Jeong LEE, YEON HEE 2024-01-12T18:04:01Z 2024-01-12T18:04:01Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/93275 English Comparison of Quantitative Analysis for CIGS Thin Films by TOFSIMS, Magnetic Sector SIMS, and AES Conference 1 International Conference on Secondary Ion Mass Spectrometry International Conference on Secondary Ion Mass Spectrometry KO