LEE, YEON HEE Lee Ji-hye 김선희 Kang Minhwa 2024-01-12T18:04:05Z 2024-01-12T18:04:05Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/93281 English Surface Analysis and Depth Profiling of Polymers by TOF-SIMS Conference 1 The 15th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions The 15th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions JA