Ankush Vij Amanpal Singh Ravi Kumar Sanjeev Gautam Dinesh Kumar CHAE, KEUN HWA 2024-01-12T18:34:39Z 2024-01-12T18:34:39Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/93875 English Sol-gel X-ray diffraction X-ray absorption spectroscopy Near edge X-ray absorption fine structure study of Zn0.8Mg0.2O thin films Conference 1 AIP conference proceedings, v.1536, pp.721 - 722 AIP conference proceedings 1536 721 722 US