김선희 Lee Ji-hye LIM, WEON CHEOL LEE, YEON HEE 2024-01-12T21:34:36Z 2024-01-12T21:34:36Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/97241 English TOF-SIMS imaging identification signatures Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging Conference 2 표면분석심포지움 표면분석심포지움 KO