Kim, Bo Seul Kim Do Hyung You Dongyoun Lee Sang Yeol 2024-01-12T22:04:48Z 2024-01-12T22:04:48Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/97821 English Effects of post-annealing temperature on electrical performances in amorphous SiInZnO thin film transistor Conference 2 한국전기전자재료학회 한국전기전자재료학회 KO