LIM, WEON CHEOL Lee Ji-hye Won, Sung Ok LEE, YEON HEE 2024-01-12T22:05:43Z 2024-01-12T22:05:43Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/97889 English CIGS SIMS quantitative analysis Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry Conference 1 8th international symposium on atomic level charaterizations for new materials and devices'11 - in conjunction with IUMAS-V -, v.1, pp.174 - 176 8th international symposium on atomic level charaterizations for new materials and devices'11 - in conjunction with IUMAS-V - 1 174 176 KO