Hong Seung Hee Heung Nam Han Phaniraj Madakashira Kim, Dong-Ik Ahn, Jae Pyoung Cho, Young Whan 2024-01-12T22:07:26Z 2024-01-12T22:07:26Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/98014 English SOFC Interconnect EBSD TEM oxidation Microstructural analysis of oxide layer formation of ferritic stainless steel interconnect Conference 1 Microscopy of oxidation 8 Microscopy of oxidation 8 UK