P.P. Choi I. Povstugar Ahn, Jae Pyoung A. Kostka D. Raabe 2024-01-12T22:35:58Z 2024-01-12T22:35:58Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/98457 English Hard coating atom probe microscopy multilayer thermal stability atom probe tomography Thermal stability of TiAlN/CrN multilayer coatings studied by Atom Probe Tomography Conference 1 IFES 2010 IFES 2010 AT