Lee Sang Yeol Chong Eu Gene Kim Seung Han Chun Yoon Soo 2024-01-12T22:36:07Z 2024-01-12T22:36:07Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/98468 English Comprehensive study on the bias and temperature induced instability of ZnO based thin film transistors Conference 1 Changchun 2010 Changchun 2010 CC