KIST Library Institutional Repository

A design of Novel IGBT with Oblique Trench Gate

Authors

Oh Juhyun; Chun Daehwan; Lee Eui-Bok; Kim, Young-Hwan; KIM, CHUN KEUN; Byeong Kwon Ju; Man Young Sung; Kim, Yong Tae

Citation

2010 Asia-Pacific Workshop on fundamentals and Applications of Advanced Semiconductor Devices, v.110, no.110, pp.57 - 59

Keywords

Trench IGBT; Breakdown voltage; Electric field distribution

URI

https://pubs.kist.re.kr/handle/201004/100192

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML