Full metadata record

DC Field Value Language
dc.contributor.authorAhn, Jae Pyoung-
dc.date.accessioned2024-01-13T01:00:59Z-
dc.date.available2024-01-13T01:00:59Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/100618-
dc.languageEnglish-
dc.subjectnano probe-
dc.subjectnano tip-
dc.subjectnano manipulator-
dc.subjectFIB-
dc.titleNanotip manufacture and current measurement using Au nanowire in FIB-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationInternational symposium on materials characterization using nanoprobe-
dc.citation.titleInternational symposium on materials characterization using nanoprobe-
dc.citation.conferencePlaceIT-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE