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Other Titles

형광 나노 실리카 입자를 이용한 멤브레인 표면 손상 탐지 기술개발

Authors

Shim Kyu-hwan; Kim Ki Pal; CHO, JIN WOO

Citation

대한환경공학회 춘계학술발표회

Keywords

형광나노입자; 분리막; 표면검측; 검측시스템; integrity

URI

https://pubs.kist.re.kr/handle/201004/100768

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KIST Conference Paper > Others

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