DSpace at KIST: Atomic Scale Simulation of Interface and Surface Phenomena during Thin Film Growth

Browse

My Repository

DSpace at KISTKIST Conference Paper Others

Atomic Scale Simulation of Interface and Surface Phenomena during Thin Film Growth

Authors: Lee, Kwang Ryeol

Citation: SISPAD 2009

Keywords: MD simulation; surface; interface; semiconductor

URI: https://pubs.kist.re.kr/handle/201004/101137

Appears in Collections:: KIST Conference Paper > Others

Files in This Item:

Export: RIS (EndNote); XLS (Excel); XML

Show Full Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE