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TOF-SIMS and XPS analysis of ancient and forensic materials

Authors

LEE, YEON HEE; Lee Ji-hye; 함승욱; LEE, KANG BONG; 김강진

Citation

ACS National Meeting and Exposition, v.237

Keywords

TOF-SIMS; XPS; Forensic; Ancient remains

URI

https://pubs.kist.re.kr/handle/201004/101400

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KIST Conference Paper > Others

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