Characteristics of phase change memory devices based on Ge-doped SbTe and its derivative

Authors
CHEONG, BYUNG KIJeung-hyun JeongLee SuyounKim InhoWu ZheAhn Hyoung WooKim Seul-ChamLEE HYUN SUCKPark Young-wook
Citation
Euporean Phase Change and Ovonics Symposium
Keywords
non-volatile memory; phase change memory material; Ge-doped SbTe; nitrogen
URI
https://pubs.kist.re.kr/handle/201004/103086
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KIST Conference Paper > Others
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