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Material and Device Characteristics of Ge-doped SbTe-N Phase Change Memory Material

Authors

Wu Zhe; Lee Suyoun; Jeung-hyun Jeong; Kim Inho; Kim Seul-Cham; Kyu Hwan Oh; CHEONG, BYUNG KI

Citation

Materials Research Society

URI

https://pubs.kist.re.kr/handle/201004/103495

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KIST Conference Paper > Others

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