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Effect of Oxygen Stoichiometry on Resistive Switching Characteristics of Pr0.7Ca0.3MnO3 Thin Films Grown by Pulsed Laser Deposition

Authors

Kim, Young Hwan; Kim Dong Soo; Jung, Sung Mok; Kim, Seong Il; Kim, Yong Tae

Citation

Materials Research Society 2006 spring meeting

Keywords

memory; oxide

URI

https://pubs.kist.re.kr/handle/201004/104125

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KIST Conference Paper > Others

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