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Scaling of Phase Changing Volume Dimension and Material Issues on Phase Change Random Access Memory

Authors

Kim, Yong Tae; Youm Min Soo; Kwon Young Suk; Sung Man Young

Citation

International Conference on Electrical Engineering (ICEE) 2006

Keywords

PRAM

URI

https://pubs.kist.re.kr/handle/201004/104210

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KIST Conference Paper > Others

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