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A novel ultrafine particle measurement system with an electrometer

Authors

Park, Sang Soo; Lee, Chang Jin; Kim, Soo Won; LEE, SEUNG BOK; Bae, Gwi-Nam; Moon, Kil Choo (K.C)

Citation

2005 IEEE International Midwest Symposium on Circuits and Systems, pp.70

Keywords

ultrafine particle; electrometer; charging

URI

https://pubs.kist.re.kr/handle/201004/104945

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KIST Conference Paper > Others

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