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Measurement of complex permittivity of thin PCB substrate using open-ended coaxial probe

Authors

Jung Ji-Hyun; 조유선; Kim, Se Yun

Citation

Korea-Japan Joint Conference on AP/EMC/EMT, pp.155 - 158

Keywords

프로브; 유전율; PCB; probe; permittivity; PCB

URI

https://pubs.kist.re.kr/handle/201004/105086

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KIST Conference Paper > Others

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