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Writing Current Reduction for High-density Phase-change RAM

Authors

Y.N. Hwang,; S. H. Lee; S. J. Ahn; S. Y. Lee; K. C. Ryoo; H. S. Hong; Koo, Hyun Cheol; Y. Fai; J. H. Oh; H. J. Kim; W. C. Jeong; J. H. Park; H. Horii; Y. H. Ha; J.H. Yi; G. H. Koh; G. T. Jeong; H. S. Jeong; Kinam Kim

Citation

IEDM Technical Digest, pp.37.1.1 - 37.1.4

Keywords

writing Current; phase change RAM

URI

https://pubs.kist.re.kr/handle/201004/105810

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KIST Conference Paper > Others

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