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New model for low frequency noise in poly-Si resistors

Authors

Lee, Jung Il; Han, Il Ki; Sookyung Chang; Eunkyu Kim

Citation

International Women's Conference on BIEN Technology, pp.408 - 409

Keywords

low frequency noise; poly-Si resistors; thermal activation; tunneling; random walk of electrons; thermionic emission

URI

https://pubs.kist.re.kr/handle/201004/105953

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KIST Conference Paper > Others

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