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Characterization of 5-inch free-standing diamond wafers deposited by single-cathode DCPACVD.

Authors

Baik Young Joon; 채기웅; Lee Wook Seong

Citation

Proc. the 8th International Conference New Diamond Science and Technology 2002

URI

https://pubs.kist.re.kr/handle/201004/106800

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KIST Conference Paper > Others

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