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Effects of charge trapping on the asymmetrical shift of memory window in MFIS devices

Authors

이용원; 강동; 노용한; Sung-Kyun Lee; Kim Yong Tae

Citation

International Joint Conference on the Applications of Ferroelectrics 2002 (IFFF 2002), pp.231

Keywords

charge trapping; asymmetric shift; memory window; 강유전체소자

URI

https://pubs.kist.re.kr/handle/201004/106913

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KIST Conference Paper > Others

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