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EL-MoM5 effects of Bi/Sr stoichiometric ratio on electrical properties of Pt/SrBi2Nb2O9/Si ferroelectric gate structure

Authors

Kim Yong Tae; Kim Seong Il; 최인훈; 최훈상; 이창우

Citation

2001 AVS 48th International Symposium, pp.7

Keywords

NDRO-FRAM

URI

https://pubs.kist.re.kr/handle/201004/108052

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KIST Conference Paper > Others

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