KIST Library Institutional Repository

Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD

Authors

임동섭; Byun Dongjin; Kim Gyeung Ho; Nam Ok-Hyun; 최인훈; Park Dal keun; Kum Dong Wha

Citation

Materials research society symposium proceedings,, v.v. 423, pp.451 - 456

Keywords

GaN

URI

https://pubs.kist.re.kr/handle/201004/111476

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML