KIST Library Institutional Repository

Enhanced via reliability by Al-reflow for multi-level metallization

Authors

Park In Seon; 위영진; 이현덕; 박창수; 최길현; Jung Woo Sang; 이문용; 이문용

Citation

International conference on VLSI and CAD (ICVC, 95), v.95, no.195, pp.29 - 32

Keywords

Al-reflow

URI

https://pubs.kist.re.kr/handle/201004/111831

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML