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Low-temperature fracture behavior of molybdenum wires doped with La2O3 or K-Si-Oxides

Authors

T. Hoshika; Y. Hiraoka; Myung Ki You; CHOI JU

Citation

Inter. symp. on advanced mater. and technology for the 21st century, pp.124

Keywords

molybdenum; fracture; oxide

URI

https://pubs.kist.re.kr/handle/201004/111960

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KIST Conference Paper > Others

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