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Electron diffraction patterns from Si-BP films epitaxially grown on Si substrates

Authors

Ju Byeong Kwon; S. R. Rho; C. J. Kim

Citation

IEEE region 10 conference, Seoul, Korea., pp.1252 - 1256

Keywords

silicon on insulator; SOI device

URI

https://pubs.kist.re.kr/handle/201004/112790

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KIST Conference Paper > Others

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