Indium-Gallium-Zinc Oxide-Based Synaptic Charge Trap Flash for Spiking Neural Network-Restricted Boltzmann Machine

Authors
Park, EunpyoJang, SuyeonNoh, GichangJo, YooyeonLee, Dae KyuKim, In SooSong, Hyun-CheolKim, SangbumKwak, Joon Young
Issue Date
2023-10
Publisher
American Chemical Society
Citation
Nano Letters, v.23, no.20, pp.9626 - 9633
Abstract
Recently, neuromorphic computing has been proposed to overcome the drawbacks of the current von Neumann computing architecture. Especially, spiking neural network (SNN) has received significant attention due to its ability to mimic the spike-driven behavior of biological neurons and synapses, potentially leading to low-power consumption and other advantages. In this work, we designed the indium-gallium-zinc oxide (IGZO) channel charge-trap flash (CTF) synaptic device based on a HfO2/Al2O3/Si3N4/Al2O3 layer. Our IGZO-based CTF device exhibits synaptic functions with 128 levels of synaptic weight states and spike-timing-dependent plasticity. The SNN-restricted Boltzmann machine was used to simulate the fabricated CTF device to evaluate the efficiency for the SNN system, achieving the high pattern-recognition accuracy of 83.9%. We believe that our results show the suitability of the fabricated IGZO CTF device as a synaptic device for neuromorphic computing.
Keywords
MEMORY; GATE; TRANSISTOR; DEVICE; nonvolatile memory; charge trap flash; neuromorphiccomputing; oxide semiconductor; spiking neural network
ISSN
1530-6984
URI
https://pubs.kist.re.kr/handle/201004/113178
DOI
10.1021/acs.nanolett.3c03510
Appears in Collections:
KIST Article > 2023
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