Solution-processed flexible nonvolatile organic field-effect transistor memory using polymer electret

Authors
Kim, J.Ho, D.Kim, I.S.Kim, M.-G.Baeg, K.-J.Kim, C.
Issue Date
2021-12
Publisher
Elsevier B.V.
Citation
Organic Electronics, v.99
Abstract
Flexible organic field-effect-transistor (OFET) memory is one of the promising candidates for next-generation wearable nonvolatile data storage due to its low price, solution-processability, light-weight, mechanically flexibility, and tunable energy level via molecular tailoring. In this paper, we report flexible nonvolatile OFET memory devices fabricated with solution-processed polystyrene-brush electret and organic semiconductor blends of p-channel 6, 13-bis-(triisopropylsilylethynyl)pentacene (TIPS-PEN) and n-channel poly-{[N,N′-bis(2- octyldodecyl)-naphthalene-1,4,5,8-bis-(dicarboximide)-2,6-diyl]-alt-5,5′-(2,2′-bithiophene)} (P-(NDI2OD-2T); N2200). Fabricated flexible OFET memory devices exhibited high memory window (30 V) and ON/OFF current ratio (memory ratio) over 103. Furthermore, we obtained reliable memory ratio (~103) over retention time of 108 s, 100 times of repeated programming/erasing cycles, and 1000 times of bending tests at a radius of 3 mm. ? 2021 Elsevier B.V.
Keywords
Bending tests; Naphthalene; Nonvolatile storage; Organic field effect transistors; Polymer blends; Data storage; Flexible; Non-volatile; Non-volatile data; Organic field-effect transistors; Organic nonvolatile memory; Polymer electret; Semiconductor blend; Solution process; Solution-processed; Electrets; Bending tests; Naphthalene; Nonvolatile storage; Organic field effect transistors; Polymer blends; Data storage; Flexible; Non-volatile; Non-volatile data; Organic field-effect transistors; Organic nonvolatile memory; Polymer electret; Semiconductor blend; Solution process; Solution-processed; Electrets; Flexible; Organic field-effect transistor; Organic nonvolatile memory; Polymer electret; Semiconductor blends; Solution-process
ISSN
1566-1199
URI
https://pubs.kist.re.kr/handle/201004/116030
DOI
10.1016/j.orgel.2021.106331
Appears in Collections:
KIST Article > 2021
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