Auger electron and x-ray photoelectron spectroscopy studies of oxidation of tin using SnOx thin films grown by reactive ion-assisted deposition.
- Title
- Auger electron and x-ray photoelectron spectroscopy studies of oxidation of tin using SnOx thin films grown by reactive ion-assisted deposition.
- Keywords
- oxidation state of tin
- Issue Date
- 1996-01
- Publisher
- Japanese journal of applied physics Part 1
- Citation
- v. 35, no. 11, 5820-5824
- Appears in Collections:
- KIST Publication > Article
- Files in This Item:
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