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dc.contributor.authorChoi, Mingi-
dc.contributor.authorIbrahim, Ismail A. M.-
dc.contributor.authorKim, Kyeounghak-
dc.contributor.authorKoo, Ja Yang-
dc.contributor.authorKim, Seo Ju-
dc.contributor.authorSon, Ji-Won-
dc.contributor.authorHan, Jeong Woo-
dc.contributor.authorLee, Wonyoung-
dc.date.accessioned2024-01-19T17:32:34Z-
dc.date.available2024-01-19T17:32:34Z-
dc.date.created2021-09-05-
dc.date.issued2020-05-13-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/118622-
dc.description.abstractCation segregation, particularly Sr segregation, toward a perovskite surface has a significant effect on the performance degradation of a solid oxide cell (solid oxide electrolysis/fuel cell). Among the number of key reasons generating the instability of perovskite oxide, surface-accumulated positively charged defects (oxygen vacancy, V-o(center dot center dot)) have been considered as the most crucial drivers in strongly attracting negatively charged defects (SrA - site') toward the surface. Herein, we demonstrate the effects of a heterointerface on the redistribution of both positively and negatively charged defects for a reduction of V-o(center dot center dot) at a perovskite surface. We took Sm0.5Sr0.5CoO3-delta (SSC) as a model perovskite film and coated Gd0.1Ce0.9O2-delta (GDC) additionally onto the SSC film to create a heterointerface (GDC/SSC), resulting in an similar to 11-fold reduction in a degradation rate of similar to 8% at 650 degrees C and similar to 10-fold higher surface exchange (k(q)) than a bare SSC film after 150 h at 650 degrees C. Using X-ray photoelectron spectroscopy and electron energy loss spectroscopy, we revealed a decrease in positively charged defects of V-o(center dot center dot) and transferred electrons in an SSC film at the GDC/SSC heterointerface, resulting in a suppression of negatively charged Sr (Sr-Sm') segregation. Finally, the energetic behavior, including the charge transfer phenomenon, O p-band center, and oxygen vacancy formation energy calculated using the density functional theory, verified the effects of the heterointerface on the redistribution of the charged defects, resulting in a remarkable impact on the stability of perovskite oxide at elevated temperatures.-
dc.languageEnglish-
dc.publisherAmerican Chemical Society-
dc.subjectTOTAL-ENERGY CALCULATIONS-
dc.subjectSTABILIZED-ZIRCONIA-
dc.subjectCATION SEGREGATION-
dc.subjectOXYGEN VACANCIES-
dc.subjectSR SEGREGATION-
dc.subjectCATHODE-
dc.subjectTEMPERATURE-
dc.subjectEXCHANGE-
dc.subject(LA,SR)COO3-DELTA-
dc.subjectHETEROINTERFACES-
dc.titleEngineering of Charged Defects at Perovskite Oxide Surfaces for Exceptionally Stable Solid Oxide Fuel Cell Electrodes-
dc.typeArticle-
dc.identifier.doi10.1021/acsami.9b21919-
dc.description.journalClass1-
dc.identifier.bibliographicCitationACS Applied Materials & Interfaces, v.12, no.19, pp.21494 - 21504-
dc.citation.titleACS Applied Materials & Interfaces-
dc.citation.volume12-
dc.citation.number19-
dc.citation.startPage21494-
dc.citation.endPage21504-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000535246100032-
dc.identifier.scopusid2-s2.0-85088016130-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordPlusTOTAL-ENERGY CALCULATIONS-
dc.subject.keywordPlusSTABILIZED-ZIRCONIA-
dc.subject.keywordPlusCATION SEGREGATION-
dc.subject.keywordPlusOXYGEN VACANCIES-
dc.subject.keywordPlusSR SEGREGATION-
dc.subject.keywordPlusCATHODE-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusEXCHANGE-
dc.subject.keywordPlus(LA,SR)COO3-DELTA-
dc.subject.keywordPlusHETEROINTERFACES-
dc.subject.keywordAuthorSolid oxide fuel cell-
dc.subject.keywordAuthorPerovskite oxide-
dc.subject.keywordAuthorStability-
dc.subject.keywordAuthorCation segregation-
dc.subject.keywordAuthorCharged defects-
dc.subject.keywordAuthorHeterointerface-
dc.subject.keywordAuthorRedistribution-
dc.subject.keywordAuthorElectron transfer-
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