Transmission-EBSD using high current electron beams

Authors
Abbasi, M.Kim, D.-I.Guim, H.-U.Jung, W.-S.
Issue Date
2016-07
Publisher
Cambridge University Press
Citation
Microscopy and Microanalysis, v.22, no.S3, pp.1652 - 1653
Abstract
[No abstract available]
Keywords
Transmission-EBSD; Transmitted Kikuchi Diffraction; Ion implantation
ISSN
1431-9276
URI
https://pubs.kist.re.kr/handle/201004/123939
DOI
10.1017/S1431927616009107
Appears in Collections:
KIST Article > 2016
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE