Electronic structure and magnetic properties of Co doped TiO2 thin films using X-ray absorption spectroscopy
- Authors
- Kumar, Shalendra; Park, J. S.; Kim, D. J.; Lee, M. H.; Song, Tae Kwon; Gautam, Sanjeev; Chae, K. H.; Kim, S. S.; Kim, M. -H.
- Issue Date
- 2015-11
- Publisher
- ELSEVIER SCI LTD
- Citation
- CERAMICS INTERNATIONAL, v.41, pp.S370 - S375
- Abstract
- The thin film of Ti0.93Co0.05O2-delta has been grown on LaAlO3 (100) substrate using pulsed laser deposition method. X-ray diffraction, near-edge X-ray absorption fine structure (NEXAFS) spectroscopy, X-ray magnetic circular dichroism (XMCD) and magnetic hysteresis loop measurements were used to fully understand the origin of ferromagnetism. Our structural analysis reveals a single phase nature of the film and excludes the presence of any secondary phase. NEXAFS spectra collected at Ti L-3,L-2, and Co L-3,L-2 -edge infer that Co and Ti ions are in 2+ and 4+ valence states, respectively. Multiplet calculation performed at Co L-3,L-2 -edge also support the experimental observations and shows that Co ions are in 2+ valence state in O-h (octahedral) symmetry. Zero field cooled and field cooled magnetization infer that T-C of Ti0.95Co0.05O2-delta film is above room temperature. DC magnetization hysteresis loop study and XMCD measurement at Co L-3,L-2 -edge reflect that Ti0.95Co0.05O2-delta film exhibits ferromagnetic ordering at room temperature. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
- Keywords
- ROOM-TEMPERATURE FERROMAGNETISM; ROOM-TEMPERATURE FERROMAGNETISM; Magnetic properties; Electronic material; Thin film; PLD; NEXAFS
- ISSN
- 0272-8842
- URI
- https://pubs.kist.re.kr/handle/201004/124832
- DOI
- 10.1016/j.ceramint.2015.03.209
- Appears in Collections:
- KIST Article > 2015
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