Enhanced device performances of WSe2-MoS2 van der Waals junction p-n diode by fluoropolymer encapsulation
- Authors
- Jeon, Pyo Jin; Min, Sung-Wook; Kim, Jin Sung; Raza, Syed Raza Ali; Choi, Kyunghee; Lee, Hee Sung; Lee, Young Tack; Hwang, Do Kyung; Choi, Hyoung Joon; Im, Seongil
- Issue Date
- 2015-03
- Publisher
- ROYAL SOC CHEMISTRY
- Citation
- JOURNAL OF MATERIALS CHEMISTRY C, v.3, no.12, pp.2751 - 2758
- Abstract
- Two-dimensional heterojunction diodes with WSe2 and MoS2 nanoflakes respectively as p-and n-type semiconductors were fabricated on both glass and SiO2/p(+)-Si by direct imprinting. Superior electrostatic and dynamic performances were acquired from the diode on glass when an electric dipole-containing fluoropolymer was employed for encapsulation: forward and reverse current toward ideal behavior, enhanced aging/ambient stability, and improved dynamic rectification resulted.
- Keywords
- BIAS LEAKAGE CURRENT; SURFACE-CHEMISTRY; LAYER MOS2; WSE2; GATE; TRANSISTORS; MONOLAYERS; BIAS LEAKAGE CURRENT; SURFACE-CHEMISTRY; LAYER MOS2; WSE2; GATE; TRANSISTORS; MONOLAYERS; WSe2; MoS2; van der Waals junction p?n diode; fluoropolymer encapsulation
- ISSN
- 2050-7526
- URI
- https://pubs.kist.re.kr/handle/201004/125735
- DOI
- 10.1039/c4tc02961e
- Appears in Collections:
- KIST Article > 2015
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