Highly Stable and Imperceptible Electronics Utilizing Photoactivated Heterogeneous Sol-Gel Metal-Oxide Dielectrics and Semiconductors

Authors
Jo, Jeong-WanKim, JaekyunKim, Kyung-TaeKang, Jin-GuKim, Myung-GilKim, Kwang-HoKo, HyungdukKim, Yong-HoonPark, Sung Kyu
Issue Date
2015-02-18
Publisher
WILEY-V C H VERLAG GMBH
Citation
ADVANCED MATERIALS, v.27, no.7, pp.1182 - 1188
Abstract
Incorporation of Zr into an AlOx matrix generates an intrinsically activated ZAO surface enabling the formation of a stable semiconducting IGZO film and good interfacial properties. Photochemically annealed metal-oxide devices and circuits with the optimized sol-gel ZAO dielectric and IGZO semiconductor layers demonstrate the high performance and electrically/mechanically stable operation of flexible electronics fabricated via a low-temperature solution process.
Keywords
THIN-FILM TRANSISTORS; FIELD-EFFECT TRANSISTORS; LOW-TEMPERATURE FABRICATION; GATE DIELECTRICS; ROOM-TEMPERATURE; PERFORMANCE; SUBSTRATE; CIRCUITS; ROUTE; TFTS; THIN-FILM TRANSISTORS; FIELD-EFFECT TRANSISTORS; LOW-TEMPERATURE FABRICATION; GATE DIELECTRICS; ROOM-TEMPERATURE; PERFORMANCE; SUBSTRATE; CIRCUITS; ROUTE; TFTS; Deep UV photo-chemical activation; Flexible metal oxide gate dielectric; Low temperature; Rollable metal oxide TFT; Solution process
ISSN
0935-9648
URI
https://pubs.kist.re.kr/handle/201004/125757
DOI
10.1002/adma.201404296
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KIST Article > 2015
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