Selectivities of an all-wet-processed electrode film on ITO, ZnO, SiNx and doped Si for solar cell applications
- Authors
- Kim, Areum; Choi, Hee Soo; Lee, Seon Jea; Choi, Eunmi; Cui, Yinhua; Lee, Ukjae; Kim, Soo-Kil; Yoon, Songhun; Son, Hyung Bin; Pyo, Sung Gyu; Yoon, Sung Pil
- Issue Date
- 2014-07
- Publisher
- KOREAN PHYSICAL SOC
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.65, no.2, pp.222 - 228
- Abstract
- We investigated the role of Ni/Cu metallization and the characteristics of selective thin-film deposition on the Indium tin oxide (ITO), ZnO, SiNx and doped Si surfaces of a silicon solarcell electrode. We propose Ni/Cu metallization as an alternative to silver screen-printing. Our method, called the selective electrode formation (SEF) process, utilizes a low-cost, streamlined wet chemical process. Metallization was confirmed to occur on the Si electrode with adhesion through Pd activation. Ni, which hinders Cu diffusion, was then selectively deposited from a NaH2PO2 based nickel solution, and Cu, the main electrode material, was deposited from a HCHObased copper solution. Ni/Cu was deposited on the ZnO, ITO, or SiNx film. The deposition and the heat treatment of Ni and Cu were successfully performed on a substrate consisting of a patterned n(+)-doped wafer with POCl3 by maintaining the same steady process conditions as in process.
- Keywords
- NICKEL SILICIDE; CONTACT RESISTANCE; NI/CU CONTACT; METALLIZATION; IMPROVEMENT; SCHEME; LAYERS; NICKEL SILICIDE; CONTACT RESISTANCE; NI/CU CONTACT; METALLIZATION; IMPROVEMENT; SCHEME; LAYERS; SiNx; ZnO; ITO; doped Si; Electroless plating
- ISSN
- 0374-4884
- URI
- https://pubs.kist.re.kr/handle/201004/126656
- DOI
- 10.3938/jkps.65.222
- Appears in Collections:
- KIST Article > 2014
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