Microstructure and microwave dielectric properties of Bi12SiO20 ceramics

Authors
Jeong, Byoung-JikJoung, Mi-RiKweon, Sang-HyoKim, Jin-SeongNahm, SahnChoi, Ji-WonHwang, Seong-Ju
Issue Date
2012-12
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
MATERIALS RESEARCH BULLETIN, v.47, no.12, pp.4510 - 4513
Abstract
Bi12SiO20 ceramics were well sintered at 800 degrees C after calcination at 700 degrees C. A liquid phase of composition Bi2O3 was formed during the sintering at temperatures >= 800 degrees C and assisted the densification of the Bi12SiO20 ceramics. When the sintering temperature exceeded 800 degrees C, however, the relative density, epsilon(r), and Q x f values of the Bi12SiO20 ceramics decreased, probably due to the formation of a large amount of the liquid phase. The Bi12SiO20 ceramics sintered at 800 degrees C for 5.0 h exhibited excellent microwave dielectric properties with a high epsilon(r) of 43, a high Q x f of 86,802 GHz and a small tau(f) of -10.39 ppm/degrees C. (C) 2012 Elsevier Ltd. All rights reserved.
Keywords
GLASSES; B2O3; SI; GLASSES; B2O3; SI; Ceramics; Oxides; Dielectric properties; Microstructure
ISSN
0025-5408
URI
https://pubs.kist.re.kr/handle/201004/128600
DOI
10.1016/j.materresbull.2012.08.075
Appears in Collections:
KIST Article > 2012
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