Temperature Dependence of the Optical Properties of High-density GaAs Quantum Dots

Abstract

We investigate the effect of the quantum dot (QD) density on the thermal escape and the re-trapping processes of carriers for unstrained GaAs/AlGaAs QDs through temperature-dependent photoluminescence measurements. We fabricated high-density GaAs QDs (8.4 x 10(10)/cm(2), dot-dot distance similar to 34 nm) on an Al0.3Ga0.7As/GaAs (111) A surface by using droplet epitaxy. The average lateral size and height of the GaAs QDs are 24 and 6 nm, respectively. Temperature-dependent photoluminescence (PL) studies show that high-density GaAs QDs undergo a sigmoidal-shape energy shift. The sigmoidal dependence of the PL peak energy can be explained by thermal escaping of carriers followed by re-trapping by QDs. Our analysis indicates that the re-trapping probability of thermally-escaped carriers increases with decreasing dot-to-dot distance (corresponding to an increase in the QD density).