Perpendicular Magnetic Tunnel Junctions Having CoFeB/CoPt Alloy Layers

Authors
Choi, Gyung-MinMin, Byoung-ChulShin, Kyung-Ho
Issue Date
2012-03
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON MAGNETICS, v.48, no.3, pp.1130 - 1133
Abstract
We have fabricated perpendicular magnetic tunnel junctions consisting of hcp Ru underlayer/hcp CoPt alloy/CoFeB/MgO/CoFeB/CoPt alloy (or Co)/Pt capping layer. By inserting the CoPt alloy (or Co) between the CoFeB and Pt capping layers, it is possible to increase a perpendicular magnetic anisotropy of the top electrode. Using a top electrode of Co40Fe40B20(0.4 nm)nm/Co72Pt28(1.6 nm)/Pt, we have obtained an effective magnetic anisotropy of 3.3 x 10(6) crg/cm(3) and a tunnel magnetoresistance (TMR) of 9.4%. The analysis of the crystal structure reveals that the low TMR is a consequence of the fcc (111) texture of CoFeB layers.
Keywords
FILMS; MAGNETORESISTANCE; ELECTRODES; ANISOTROPY; BARRIER; DEVICE; Magnetic tunnel junctions (MTJs); perpendicular magnetic anisotropy (PMA); tunnel magnetoresistance (TMR)
ISSN
0018-9464
URI
https://pubs.kist.re.kr/handle/201004/129455
DOI
10.1109/TMAG.2011.2176744
Appears in Collections:
KIST Article > 2012
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