Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bouzid, Abdessattar | - |
dc.contributor.author | Park, Jun-Bum | - |
dc.contributor.author | Kim, Se Min | - |
dc.contributor.author | Kwak, Sean | - |
dc.contributor.author | Moon, Sung | - |
dc.date.accessioned | 2024-01-20T17:03:26Z | - |
dc.date.available | 2024-01-20T17:03:26Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2011-05 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/130390 | - |
dc.description.abstract | To better understand how the active hold-off technique in single-photon detectors (SPDs) based on InGaAs/InP avalanche photodiodes (APDs) enhances the performance of a quantum key distribution (QKD) system based on the BB84 protocol, we have evaluated the dependence of the raw key creation rate (R-raw) as well as the quantum bit error rate (QBER) on the number of active hold-off gates. The results of our analysis reveal that at 10 MHz repetition rate of the gate, by holding-off 200 gate pulses immediately following an avalanche event, the afterpulse contribution to the QBER drops down to 2.35% without noticeable decrease in the R-raw. (c) 2010 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER | - |
dc.subject | HIGH-PERFORMANCE | - |
dc.subject | 1550 NM | - |
dc.subject | PHOTODIODES | - |
dc.title | Characterization of a single-photon detector at 1.55 mu m operated with an active hold-off technique for quantum key distribution | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.cap.2010.12.017 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.11, no.3, pp.903 - 908 | - |
dc.citation.title | CURRENT APPLIED PHYSICS | - |
dc.citation.volume | 11 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 903 | - |
dc.citation.endPage | 908 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.kciid | ART001555655 | - |
dc.identifier.wosid | 000288183300122 | - |
dc.identifier.scopusid | 2-s2.0-79951671662 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | HIGH-PERFORMANCE | - |
dc.subject.keywordPlus | 1550 NM | - |
dc.subject.keywordPlus | PHOTODIODES | - |
dc.subject.keywordAuthor | Avalanche photodiode | - |
dc.subject.keywordAuthor | Single-photon detector | - |
dc.subject.keywordAuthor | Quantum key distribution | - |
dc.subject.keywordAuthor | Raw key creation rate | - |
dc.subject.keywordAuthor | Quantum bit error rate | - |
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