Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Ik-Jae | - |
dc.contributor.author | Yu, Chung-Jong | - |
dc.contributor.author | Yun, Young-Duck | - |
dc.contributor.author | Lee, Chae-Soon | - |
dc.contributor.author | Seo, In Deuk | - |
dc.contributor.author | Kim, Hyo-Yun | - |
dc.contributor.author | Lee, Woul-Woo | - |
dc.contributor.author | Chae, Keun Hwa | - |
dc.date.accessioned | 2024-01-20T20:01:19Z | - |
dc.date.available | 2024-01-20T20:01:19Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2010-02 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/131746 | - |
dc.description.abstract | A new hard x-ray beamline, 10B KIST-PAL beamline (BL10B), has been designed and constructed at the Pohang Light Source (PLS) in Korea. The beamline, operated by Pohang Accelerator Laboratory-Korean Institute of Science and Technology consortium, is dedicated to x-ray scattering (XRS) and x-ray absorption fine structure (XAFS) experiments. X rays with photon energies from 4.0 to 16.0 keV are delivered to the experimental station passing a collimating mirror, a fixed-exit double-crystal Si(111) monochromator, and a toroidal mirror. Basic experimental equipments for XAFS measurement, a high resolution diffractometry, an image plate detector system, and a hot stage have been prepared for the station. From our initial commissioning and performance testing of the beamline, it is observed that BL10B beamline can perform XRS and XAFS measurements successfully. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | SPECTROSCOPY | - |
dc.subject | STATE | - |
dc.title | Note: Construction of x-ray scattering and x-ray absorption fine structure beamline at the Pohang Light Source | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.3298581 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.81, no.2 | - |
dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.volume | 81 | - |
dc.citation.number | 2 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000275028400207 | - |
dc.identifier.scopusid | 2-s2.0-77949277619 | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | SPECTROSCOPY | - |
dc.subject.keywordPlus | STATE | - |
dc.subject.keywordAuthor | optical collimators | - |
dc.subject.keywordAuthor | X-ray absorption spectra | - |
dc.subject.keywordAuthor | X-ray apparatus | - |
dc.subject.keywordAuthor | X-ray diffractometers | - |
dc.subject.keywordAuthor | X-ray monochromators | - |
dc.subject.keywordAuthor | X-ray scattering | - |
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