Mechanism of shear transformation in Ge-Bi-Te alloys

Authors
Sun, Chang WooLee, Jeong YongKim, Yong Tae
Issue Date
2009-10
Publisher
WILEY-V C H VERLAG GMBH
Citation
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.3, no.7-8, pp.254 - 256
Abstract
Since the rhombohedral unit cell in the NaCl lattice is caused by distortion along the < 111 > NaCl direction, the same phenomenon is expected during phase transition of Ge-Bi-Te (GBT). With this assumption, we performed transmission electron microscopy (TEM) studies on the phase transition in GBT alloys annealed at temperatures between the two crystallization temperatures. Atomic-scale TEM images show the formation of a GBT intermediate structure during the phase transition. Using the obtained results, we developed a new phase transition model in which the Ge/Bi layers are ordered in the < 111 > direction; further, continuous shearing and dilation occur in the {111} plane in < 111 > direction. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Keywords
PHASE-CHANGE MATERIALS; SYSTEM; NACL; PHASE-CHANGE MATERIALS; SYSTEM; NACL; GeBiTe; Phase change memory
ISSN
1862-6254
URI
https://pubs.kist.re.kr/handle/201004/132125
DOI
10.1002/pssr.200903214
Appears in Collections:
KIST Article > 2009
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